Imaging sub-millimeter waves in planar cryoelectronic circuits by scanning laser microscopy
نویسندگان
چکیده
Low temperature scanning laser microscopy (LTSLM) is demonstrated to be capable of imaging sub-THz electromagnetic fields in cryoelectronic integrated structures. This method allows to evaluate the spatial distribution of timeaveraged field amplitudes with a resolution of about one micrometer for samples with characteristic dimensions of the order of millimeters. Using LTSLM, cryoelectronic devices with both passive and active superconducting elements can be characterized. Local heating of superconducting structures by a laser beam contributes introduces extra loss for the propagating and standing sub-millimeter waves. We present LTSLM images of two-dimensional standing 400 to 500 GHz wave patterns in integrated superconducting re-
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